Developing next-generation IoT wireless devices and 5G infrastructure is challenging the way users engineer smaller, faster and smarter products. In semiconductor, the push for smaller and more integrated devices is leading to smarter methodologies and flows for RF design and test. In aerospace/defense applications, electronic systems are at a crossroads of increasing system complexity and legacy hardware compatibility.
To efficiently address all phases of product development, customers can take advantage of the innovative design and test solutions from NI AWR Design Environment™, LabVIEW, and PXI that will be showcased at IMS 2016 in the NI Booth #1529, including:
- New measurement solutions for 802.11ax or high-efficiency Wi-Fi (HEW) devices
- Advances in NI AWR software design solutions for power amplifier, antenna, filter, and radar systems through new automation and tool interoperability
- Industry-leading solutions for RFIC test – from lab-based characterization systems to high-volume manufacturing test solutions
- Latest semiconductor test solutions providing lower cost, higher throughput alternatives to traditional ATE