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Third Gen Parametric Test Solution

Third Gen Parametric Test Solution
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The third generation of the P9000 series massively parallel parametric test system has been released. The system accelerates the fast ramp of new technology and reduces the cost-of-test in the development and manufacturing of advanced semiconductor logic and memory ICs. Its new test unit module allows the measurement of leaky capacitance of cutting edge semiconductor processes and provides 100-pin parallel capacitance measurement.

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