Dielectric Property Measurement Solution

In partnership with Compass Technology Group, the company has released the Epsilometer solution for measuring the dielectric properties of materials. This solution measures dielectric substrate materials at frequencies from 3 MHz up to 6 GHz and can accommodate sheet specimens 0.3 to 3mm thick. COPPER MOUNTAIN TECHNOLOGIES (4)

Connecting RF Test and Measurement Equipment to an Antenna Under Test

by Clayton Karmel, Principal, Pdicta Corp & Ben Maxson, Director, Services and Support, Copper Mountain Technologies (All images are at end of article) Connecting RF test and measurement equipment to an Antenna Under Test (AUT) usually involves tradeoffs among measurement accuracy, electrical considerations, cost, and mechanical ruggedness. In this article, we describe some aspects of […]

Windows PC’s Remain the Workhorses of RF Testing, For Now…

by Ben Maxson, Engineering Manager – Copper Mountain Technologies For decades now, RF and Microwave test instrument manufacturers and test engineers have been designing their lab test equipment and systems around Windows PCs. Lately Linux has emerged as a plausible alternative. So are Windows-centric instruments on their way out? The advantages of using Windows PCs are numerous. For […]