A Prescription for Millimeter-Wave and THz Transistor Characterization
256
0
Learn from industry experts about latest technology advances through our free IEEE MTT Society Webinars. All the live webinars are archived and are available on demand for 12 months. IEEE members can also earn PDH certificates for each webinar.
A Prescription for On-Wafer Millimeter-Wave and THz Transistor Characterization
Tuesday, 8 March 2016
12:00 PM Eastern Standard Time
Advances in microwave wafer probes and vector network analyzers now make possible accurate on-wafer measurements in printed transmission lines at microwave, millimeter-wave, sub-millimeter-wave, and even terahertz frequencies. Dr. Dylan Williams, winner of the 2013 IEEE Joseph F. Keithley Award in Instrumentation and Measurement, will introduce you to the progress made on this subject at the National Institute of Standards and Technology. He will discuss the fundamental principles behind accurate on-wafer measurements, and show how adhering to these principles has led to the development of accurate on-wafer measurements for transistor characterization at frequencies as high as 1 THz. This webinar is free to attend. To access the event please register.
Note: By registering for this webinar you understand and agree that IEEE may share your contact information with the sponsors of this webinar and that both IEEE and the sponsors may send email communications to you in the future.
(256)
