1. Home
  2. On The Market
  3. On-Wafer Performance Characterization

On-Wafer Performance Characterization

On-Wafer Performance Characterization
15
0

This test solution allows complete on-wafer performance characterization during development, product qualification, and production and combines the R&S ZNA vector network analyzer with probe systems from FormFactor. It characterizes all RF qualification parameters in coaxial and waveguide bands and up to 67 GHz. 

ROHDE & SCHWARZ

(15)

print

LEAVE YOUR COMMENT