Multi-channel Test System
The multi-channel AARTS RF test systems use existing bias supply technology augmented with a step-up voltage multiplier for a supply of 200 V or more to each device under test. The RF smart fixture has been redesigned to support local voltage and current measurement at high voltages and is equipped for high DUT power dissipation. Different channel capacities are supported, including up to 16 independently controlled channels. RF drive level can be up to 50 W per channel, and the power supplies can deliver more than 350 W power dissipation per DUT. Features include pulsed-RF modulation types for application-specific testing, high-efficiency heatsinks for managing high DUT power dissipation, high-voltage components, and local V/I measurement capability.
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